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ASPDAC
2006
ACM
128views Hardware» more  ASPDAC 2006»
15 years 1 months ago
A new test and characterization scheme for 10+ GHz low jitter wide band PLL
- This paper presents a new test and characterization scheme for 10+ GHz low jitter wide band PLL in 90 nm partially depleted (PD) Silicon-On-Insulator (SOI) CMOS technology. We me...
Kazuhiko Miki, David Boerstler, Eskinder Hailu, Ji...
CLUSTER
2006
IEEE
15 years 1 months ago
STAS: A Scalability Testing and Analysis System
Scalability is a crucial factor in performance evaluation and analysis of parallel and distributed systems. Much effort has been devoted to scalability research and several metric...
Yong Chen, Xian-He Sun
WSCG
2004
154views more  WSCG 2004»
14 years 11 months ago
Freeform Object Positioning by 3D Shape Matching Without Artificial Feature Points
Determining the position and orientation of a workpiece relative to a manufacturing device is a prerequisite for machining path planning. If the workpiece is freeform and if it co...
Joris S. M. Vergeest, Yu Song, D. Hartge
WCE
2007
14 years 11 months ago
The Observation of Output Signal of MSGS
— The strength of Micro Systems Technology (MST) is the ability to fabricate a large number of small devices economically. However such devices tend to have errors caused by the ...
K. Nishiyama, M. C. L. Ward
CDC
2009
IEEE
122views Control Systems» more  CDC 2009»
14 years 11 months ago
Experimental verification of formation control with distributed cameras
Abstract-- Formation control experiments are performed using two robots, each equipped with a camera. When both robots are fully informed of the reference velocity, a decentralized...
He Bai, Karen D. Chapin, John Wason, John T. Wen