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DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
Memory elements are the most vulnerable system component to soft errors. Since memory elements in cache arrays consume a large fraction of the die in modern microprocessors, the p...
122
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DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
— The world of 3D graphics, until recently restricted to high-end workstations and game consoles, is rapidly expanding into the domain of mobile platforms such as cellular phones...
DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
Consumer electronics products, such as high-end (digital) TVs, contain complex systems on chip (SOC) that offer high computational performance at low cost. Traditionally, these SO...
118
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DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
122
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DFT
2006
IEEE
15 years 9 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...