526 search results - page 15 / 106 » date 2008 |
83
Voted
DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
This paper describes ongoing research in the field of quantitative productivity measurement in IC Design and simulation of different scenarios as decision support. Five topics out...
74
Voted
DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
CASP, Concurrent Autonomous chip self-test using Stored test Patterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any ...
83
Voted
DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
This section will provide insight into new developments and advances in electronics automotive architectures. The design of innovative chip architectures, new upcoming standards f...
49
Voted
DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
65
Voted
DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
This paper proposes a temperature-aware dynamic voltage selection technique for energy minimization and presents a thorough analysis of the parameters that influence the potential...