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DFT
2008
IEEE
15 years 6 months ago
2008
IEEE
Scan-based debug methods give high observability of internal signals, however, they require halting the system to scan out responses from the circuit-under-debug (CUD). This is ti...
102
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DFT
2008
IEEE
15 years 1 months ago
2008
IEEE
This paper presents a concurrent error detection technique for the control logic of a modern microprocessor. Our method is based on execution time prediction for each instruction ...
DFT
2008
IEEE
15 years 6 months ago
2008
IEEE
Nanoelectronic components are expected to suffer from very high error rates, implying the need for hardening techniques. We propose a fine-grained approach to harden a promising...
DFT
2008
IEEE
15 years 6 months ago
2008
IEEE
Error detection/correction techniques have been advocated for algorithmic self-assembly. Under rectilinear growth, it requires only two additional tiles, generally referred to as ...
110
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DFT
2008
IEEE
15 years 1 months ago
2008
IEEE
This paper addresses a new threat to the security of integrated circuits (ICs). The migration of IC fabrication to untrusted foundries has made ICs vulnerable to malicious alterat...