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ITC
1996
IEEE
15 years 7 months ago
1996
IEEE
ITC
1996
IEEE
15 years 7 months ago
1996
IEEE
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ITC
1996
IEEE
15 years 7 months ago
1996
IEEE
The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.
112
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ITC
1996
IEEE
15 years 7 months ago
1996
IEEE
This paper proposes a Layered Model for boundaryscan testing to help identify opportunities for standardization. Serial Vector Format [1] and an accompanying Application Programmi...