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ITC
1998
IEEE
86views Hardware» more  ITC 1998»
13 years 10 months ago
An introduction to area array probing
Frederick L. Taber
ITC
1998
IEEE
65views Hardware» more  ITC 1998»
13 years 10 months ago
Consequences of port restrictions on testing two-port memories
Said Hamdioui, A. J. van de Goor
ITC
1998
IEEE
65views Hardware» more  ITC 1998»
13 years 10 months ago
Failure modes for stiction in surface-micromachined MEMS
Abhijeet Kolpekwar, Ronald D. Blanton, David Woodi...