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ITC
2002
IEEE
98views Hardware» more  ITC 2002»
15 years 3 months ago
An Effective Diagnosis Method to Support Yield Improvement
Camelia Hora, Rene Segers, Stefan Eichenberger, Ma...
ITC
2002
IEEE
98views Hardware» more  ITC 2002»
15 years 3 months ago
A New Algorithm for Global Fault Collapsing into Equivalence and Dominance Sets
A. V. S. S. Prasad, Vishwani D. Agrawal, Madhusuda...
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ITC
2002
IEEE
102views Hardware» more  ITC 2002»
15 years 3 months ago
Adapting an SoC to ATE Concurrent Test Capabilities
Rainer Dorsch, Ramón Huerta Rivera, Hans-Jo...