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    2010
    105views Robotics» more  MR 2010»
    Design of differential low-noise amplifier with cross-coupled-SCR ESD protection scheme
    14 years 10 months ago
    Design of differential low-noise amplifier with cross-coupled-SCR ESD protection scheme
    Download  www.ics.ee.nctu.edu.tw
    Chun-Yu Lin, Ming-Dou Ker, Yuan-Wen Hsiao
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    MR
    2006
    73views Robotics» more  MR 2006»
    Reliability of large periphery GaN-on-Si HFETs
    14 years 11 months ago
    Reliability of large periphery GaN-on-Si HFETs
    Download  www.nitronex.com
    S. Singhal, T. Li, A. Chaudhari, A. W. Hanson, R. ...
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    MR
    2006
    75views Robotics» more  MR 2006»
    New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors
    14 years 11 months ago
    New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors
    Download  sdtlab.incheon.ac.kr
    In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun ...
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    MR
    2007
    93views Robotics» more  MR 2007»
    Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly
    14 years 11 months ago
    Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly
    Download  www.imec.be
    The development of a simplified analytical model to describe the thermal history of a Printed Circuit Board assembly (PCA) during convective reflow soldering is described in this ...
    Nele Van Steenberge, Paresh Limaye, Geert Willems,...
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    MR
    2007
    107views Robotics» more  MR 2007»
    Cohesive zone modeling for structural integrity analysis of IC interconnects
    14 years 11 months ago
    Cohesive zone modeling for structural integrity analysis of IC interconnects
    Download  www.mate.tue.nl
    Due to the miniaturization of integrated circuits, their thermo-mechanical reliability tends to become a truly critical design criterion.
    B. A. E. van Hal, R. H. J. Peerlings, M. G. D. Gee...
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