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TCAD
1998
102views more  TCAD 1998»
14 years 10 months ago
A unified MOSFET channel charge model for device modeling in circuit simulation
Yuhua Cheng, Kai Chen 0002, Kiyotaka Imai, Chenmin...
TCAD
1998
81views more  TCAD 1998»
14 years 10 months ago
Characterization and parameterized generation of synthetic combinational benchmark circuits
Michael D. Hutton, Jonathan Rose, Jerry P. Grossma...
TCAD
1998
109views more  TCAD 1998»
14 years 10 months ago
Diagnosing realistic bridging faults with single stuck-at information
Successful failure analysis requires accurate fault diagnosis. This paper presents a method for diagnosing bridging faults that improves on previous methods. The new method uses s...
David B. Lavo, Brian Chess, Tracy Larrabee, F. Joe...