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111
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ISCAS
2005
IEEE
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ISCAS 2005
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A two-step DDEM ADC for accurate and cost-effective DAC testing
15 years 9 months ago
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class.ece.iastate.edu
— This paper presents a scheme for testing DACs’ static non-linearity errors by using a two-step flash ADC with deterministic dynamic element matching (DDEM). In this work, the...
Hanqing Xing, Degang Chen, Randall L. Geiger
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