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76
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VLSID
2003
IEEE
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VLSID 2003
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The Impact of Bit-Line Coupling and Ground Bounce on CMOS SRAM Performance
16 years 3 months ago
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www.ece.uic.edu
In this paper, we provide an analytical framework to study the inter-cell and intra-cell bit-line coupling when it is superimposed with the ground bounce effect and show how those...
Li Ding 0002, Pinaki Mazumder
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