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105
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ASPDAC
2005
ACM
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ASPDAC 2005
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Yield driven gate sizing for coupling-noise reduction under uncertainty
15 years 5 months ago
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users.eecs.northwestern.edu
Abstract— This paper presents a post-route gate-sizing algorithm for coupling-noise reduction that constrains the yield loss under process variations. Algorithms for coupling-noi...
Debjit Sinha, Hai Zhou
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