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69

DEPCOS
2006
IEEE

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Survey of Recovery Schemes in MPLS Networks

15 years 6 months ago

Survey of Recovery Schemes in MPLS Networks

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Luísa Jorge, Teresa Gomes

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110

DEPCOS
2006
IEEE

93views Hardware» more DEPCOS 2006»

Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

15 years 9 months ago

Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

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Zoltán Micskei, István Majzik

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