Sciweavers

Free Online Productivity Tools i2Speak i2Symbol i2OCR iTex2Img iWeb2Print iWeb2Shot i2Type iPdf2Split iPdf2Merge i2Bopomofo i2Arabic i2Style i2Image i2PDF iLatex2Rtf Sci2ools

111

DEPCOS
2006
IEEE

93views Hardware» more DEPCOS 2006»

Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

15 years 9 months ago

Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

Download home.mit.bme.hu

Zoltán Micskei, István Majzik

Real-time Traffic

DEPCOS 2006 |

claim paper

Related Content

» TinyGALS A Programming Model for EventDriven Embedded Systems

» ModelBased GUI Testing Using Uppaal at Novo Nordisk

» Model Based Development of SafetyCritical Systems Using Template Based Code Generation

» Formal Verification of Web Applications Modeled by Communicating Automata

» A Middleware for ModelBased Embedded Systems

» A Global Algorithm for ModelBased Test Suite Generation

» Model Based Test Generation for Microprocessor Architecture Validation

» An Automatic System for ModelBased Coding of Faces

» Coveragedriven automatic test generation for uml activity diagrams

Post Info
More Details (n/a)

Added	10 Jun 2010
Updated	10 Jun 2010
Type	Conference
Year	2006
Where	DEPCOS
Authors	Zoltán Micskei, István Majzik

Comments (0)