183
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DFT
2003
IEEE
16 years 21 days ago
2003
IEEE
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...
177
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DFT
2003
IEEE
16 years 21 days ago
2003
IEEE
In the last years, new requirements in terms of vehicle performance increased significantly the amount of on-board electronics, thus raising more concern about safety and fault to...