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SAC
2002
ACM
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Applied Computing
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SAC 2002
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An evolutionary algorithm for reducing integrated-circuit test application time
15 years 3 months ago
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www.cad.polito.it
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
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