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    JETC
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    Evolving dependability
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    Evolving dependability
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    Andy M. Tyrrell, Andrew J. Greensted
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    JETC
    2007
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    Designing CMOS/molecular memories while considering device parameter variations
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    Designing CMOS/molecular memories while considering device parameter variations
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    Garrett S. Rose, Yuxing Yao, James M. Tour, Adam C...
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    JETC
    2007
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    A self-organizing defect tolerant SIMD architecture
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    A self-organizing defect tolerant SIMD architecture
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    Jaidev P. Patwardhan, Chris Dwyer, Alvin R. Lebeck
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