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DAGSTUHL
2006
13 years 6 months ago
Reliability-Aware Power Management Of Multi-Core Systems (MPSoCs)
Long-term reliability of processors in embedded systems is experiencing growing attention since decreasing feature sizes and increasing power consumption have a negative influence...
Klaus Waldschmidt, Jan Haase, Andreas Hofmann, Mar...
DAC
1996
ACM
13 years 9 months ago
Hot-Carrier Reliability Enhancement via Input Reordering and Transistor Sizing
Hot-carrier eects and electromigration are the two important failure mechanisms that signi cantly impact the long-term reliability of high-density VLSI ICs. In this paper, we prese...
Aurobindo Dasgupta, Ramesh Karri