Sciweavers

131
Voted
TC
2011
14 years 4 months ago
Maximizing Spare Utilization by Virtually Reorganizing Faulty Cache Lines
—Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Since a large fraction of chip area is devoted to on-...
Amin Ansari, Shantanu Gupta, Shuguang Feng, Scott ...