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DAC
2003
ACM
15 years 2 months ago
Test application time and volume compression through seed overlapping
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
Wenjing Rao, Ismet Bayraktaroglu, Alex Orailoglu
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DAC
2001
ACM
15 years 10 months ago
Test Volume and Application Time Reduction Through Scan Chain Concealment
Ismet Bayraktaroglu, Alex Orailoglu