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DAC
2001
ACM

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Test Volume and Application Time Reduction Through Scan Chain Concealment

16 years 3 months ago

Test Volume and Application Time Reduction Through Scan Chain Concealment

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Ismet Bayraktaroglu, Alex Orailoglu

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DAC 2001 | Design Automation | Scan Chain Concealment |

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Added	13 Nov 2009
Updated	13 Nov 2009
Type	Conference
Year	2001
Where	DAC
Authors	Ismet Bayraktaroglu, Alex Orailoglu

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