Sciweavers

102
Voted
DFT
2008
IEEE
182views VLSI» more  DFT 2008»
14 years 12 months ago
Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis
This paper addresses a new threat to the security of integrated circuits (ICs). The migration of IC fabrication to untrusted foundries has made ICs vulnerable to malicious alterat...
Xiaoxiao Wang, Hassan Salmani, Mohammad Tehranipoo...