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152
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ET
2002
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ET 2002
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Signal Integrity: Fault Modeling and Testing in High-Speed SoCs
15 years 3 months ago
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www.utdallas.edu
As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay viol...
Mehrdad Nourani, Amir Attarha
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