TVLSI
2008
13 years 5 months ago
2008
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
IFIP
2001
Springer
13 years 10 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
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Ahmed Assayed
Sr. Test Engineer; currently employed at Medtronic Inc.
BS electrical engineering - Zagazig University - Egypt
MS computer engineering - North Dakota State Unive...