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113
Voted
CDC
2009
IEEE
142
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Control Systems
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CDC 2009
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Towards STEM control: Modeling framework and development of a sensor for defocus control
15 years 7 months ago
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www.dcsc.tudelft.nl
— Scanning transmission electron microscopes are indispensable tools for material science research, since they can reveal the internal structure of a wide range of specimens. Thu...
Arturo Tejada, Wouter Van den Broek, Saartje W. va...
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