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105
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DFT
2006
IEEE
85
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VLSI
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DFT 2006
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Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects
15 years 6 months ago
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www.ece.neu.edu
With the recent development of nanoscale materials and assembly techniques, it is envisioned to build high-density reconfigurable systems which have never been achieved by the pho...
Yadunandana Yellambalase, Minsu Choi, Yong-Bin Kim
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