ISVLSI 2003 - PDF Preprint Papers

ISVLSI 2003 IEEE Computer Society Annual Symposium on VLSI

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ISVLSI
2003
IEEE

157views VLSI» more ISVLSI 2003»

Joint Minimization of Power and Area in Scan Testing by Scan Cell Reordering

13 years 9 months ago

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This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...

Shalini Ghosh, Sugato Basu, Nur A. Touba

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