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ITC
2003
IEEE

Fault Injection for Verifying Testability at the VHDL Level

13 years 10 months ago
Fault Injection for Verifying Testability at the VHDL Level
This paper presents a technique to improve verification at the VHDL level of digital circuits by means of a specially designed fault injection block. The injection technique allows incorporation of both transient and permanent faults to varying levels of VHDL hierarchy, and helps in verifying the performance of a testable system.
S. R. Seward, Parag K. Lala
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where ITC
Authors S. R. Seward, Parag K. Lala
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