DSN
2008
IEEE
13 years 6 months ago
2008
IEEE
CMOS technology trends are leading to an increasing incidence of hard (permanent) faults in processors. These faults may be introduced at fabrication or occur in the field. Wherea...
ITC
1996
IEEE
13 years 8 months ago
1996
IEEE
common use is the distinction into two (abstract) fault models: A new fault modelling scheme for integrated analogue general the "Single Hard Fault Model (SHFM)" and the ...
DAC
2009
ACM
13 years 9 months ago
2009
ACM
Process scaling has given designers billions of transistors to work with. As feature sizes near the atomic scale, extensive variation and wearout inevitably make margining unecono...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
— We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based on an assemblage of learning machines that are trained beforehand to guide us through ...
ISVLSI
2007
IEEE
13 years 10 months ago
2007
IEEE
In sub-90nm technologies, more frequent hard faults pose a serious burden on processor design and yield control. In addition to manufacturing-time chip repair schemes, microarchit...
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...