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8

DATE
1997
IEEE

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New static compaction techniques of test sequences for sequential circuits

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New static compaction techniques of test sequences for sequential circuits

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Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,

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DATE 1997 | Hardware |

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Added	06 Aug 2010
Updated	06 Aug 2010
Type	Conference
Year	1997
Where	DATE
Authors	Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda

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