158 search results - page 4 / 32 » A Method for Compressing Test Data Based on Burrows-Wheeler ... |
ICIP
2006
IEEE
14 years 7 months ago
2006
IEEE
An embedded, block-based, wavelet transform coding algorithm of low complexity is proposed. Three-Dimensional Set Partitioned Embedded bloCK(3D-SPECK) efficiently encodes hyperspe...
ATS
2003
IEEE
13 years 11 months ago
2003
IEEE
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...
DATE
2003
IEEE
13 years 11 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
VTS
2003
IEEE
13 years 11 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
DFT
2002
IEEE
13 years 10 months ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...