515 search results - page 1 / 103 » A Reduced Complexity Algorithm for Minimizing N-Detect Tests |
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
? We give a new recursive rounding linear programming (LP) solution to the problem of N-detect test minimzation. This is a polynomialtime solution that closely approximates the exa...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
ETS
2009
IEEE
13 years 2 months ago
2009
IEEE
We optimize the full-response diagnostic fault dictionary from a given test set. The smallest set of vectors is selected without loss of diagnostic resolution of the given test se...
ENGL
2007
13 years 4 months ago
2007
— Power consumption has become a crucial concern in Built In Self Test (BIST) due to the switching activity in the circuit under test(CUT). In this paper we present a novel metho...
ATS
2004
IEEE
13 years 8 months ago
2004
IEEE
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...