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» A Statistic-Based Approach to Testability Analysis
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ISQED
2008
IEEE
85views Hardware» more  ISQED 2008»
13 years 11 months ago
A Statistic-Based Approach to Testability Analysis
This paper presents a statistic-based approach for evaluating the testability of nodes in combinational circuits. This testability measurement is obtained via Monte Carlo simulati...
Chuang-Chi Chiou, Chun-Yao Wang, Yung-Chih Chen
EURODAC
1994
IEEE
145views VHDL» more  EURODAC 1994»
13 years 9 months ago
Testability analysis and improvement from VHDL behavioral specifications
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng
UML
2001
Springer
13 years 9 months ago
A UML-Based Approach to System Testing
System testing is concerned with testing an entire system based on its specifications. In the context of object-oriented, UML development, this means that system test requirements ...
Lionel C. Briand, Yvan Labiche
SQJ
2002
90views more  SQJ 2002»
13 years 4 months ago
Critical Analysis of the PIE Testability Technique
Abstract. The work of Voas and colleagues has introduced, refined and applied the propagation, infection and execution (PIE) analysis technique for measuring testability of program...
Zuhoor A. Al-Khanjari, Martin R. Woodward, Haider ...
ASPDAC
1995
ACM
130views Hardware» more  ASPDAC 1995»
13 years 8 months ago
Design for testability using register-transfer level partial scan selection
Abstract - An approach to top down design for testability using register-transfer level(RTL) partial scan selection is described. We propose a scan selection technique based on tes...
Akira Motohara, Sadami Takeoka, Toshinori Hosokawa...