29 search results - page 2 / 6 » A programmable built-in self-test core for embedded memories |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
CATA
2009
13 years 6 months ago
2009
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
CSREAESA
2009
13 years 6 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...
DT
2002
13 years 5 months ago
2002