The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
Abstract— With the increasing in silicon densities, SoC designs are the stream in modern electronics systems. Accordingly, the verification for SoC designs is crucial. One of th...
Yi-Le Huang, Chun-Yao Wang, Richard Yeh, Shih-Chie...
Abstract. Visual data
ow environments are ideally suited for modeling digital signal processing (DSP) systems, as many DSP algorithms are most naturally specied by signal
ow gra...
James Hwang, Brent Milne, Nabeel Shirazi, Jeffrey ...