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ATS
2009
IEEE
138views Hardware» more  ATS 2009»
14 years 2 days ago
Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
Yubin Zhang, Lin Huang, Feng Yuan, Qiang Xu
ISCAS
2007
IEEE
120views Hardware» more  ISCAS 2007»
13 years 11 months ago
Clock Gating and Negative Edge Triggering for Energy Recovery Clock
Energy recovery clocking has been demonstrated as an effective method for reducing the clock power. In this method the conventional square wave clock signal is replaced by a sinus...
Vishwanadh Tirumalashetty, Hamid Mahmoodi
DAC
2007
ACM
14 years 6 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
VLSID
2008
IEEE
120views VLSI» more  VLSID 2008»
14 years 5 months ago
Continuous Frequency Adjustment Technique Based on Dynamic Workload Prediction
Real-time embedded systems increasingly rely on dynamic power management to balance between power and performance goals. In this paper, we present a technique for continuous frequ...
Hwisung Jung, Massoud Pedram
GLVLSI
2006
IEEE
145views VLSI» more  GLVLSI 2006»
13 years 11 months ago
Leakage current starved domino logic
A new circuit technique based on a single PMOS sleep transistor and a dual threshold voltage CMOS technology is proposed in this paper for simultaneously reducing subthreshold and...
Zhiyu Liu, Volkan Kursun