45 search results - page 1 / 9 » An efficient static algorithm for computing the soft error r... |
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Soft errors have emerged as an important reliability challenge for nanoscale VLSI designs. In this paper, we present a fast and efficient soft error rate (SER) computation algorit...
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
ISQED
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...
DSN
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper examines the effect of technology scaling and microarchitectural trends on the rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to...