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2006
IEEE

An efficient static algorithm for computing the soft error rates of combinational circuits

9 years 7 months ago
An efficient static algorithm for computing the soft error rates of combinational circuits
Soft errors have emerged as an important reliability challenge for nanoscale VLSI designs. In this paper, we present a fast and efficient soft error rate (SER) computation algorithm for combinational circuits. We first present a novel parametric waveform model based on the Weibull function to represent particle strikes at individual nodes in the circuit. We then describe the construction of the SET descriptor that efficiently captures the correlation between the transient waveforms and their associated rate distribution functions. The proposed algorithm consists of operations to inject, propagate and merge SET descriptors while traversing forward along the gates in a circuit. The parameterized waveforms enable an efficient static approach to calculate the SER of a circuit. We exercise the proposed approach on a wide variety of combinational circuits and observe that our algorithm has linear runtime with the size of the circuit. The runtimes for soft error estimation were observed to b...
Rajeev R. Rao, Kaviraj Chopra, David Blaauw, Denni
Added 10 Jun 2010
Updated 10 Jun 2010
Type Conference
Year 2006
Where DATE
Authors Rajeev R. Rao, Kaviraj Chopra, David Blaauw, Dennis Sylvester
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