12 search results - page 2 / 3 » Analysis and mitigation of process variation impacts on Powe... |
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
Process related variations are considered a major concern in emerging sub-65nm technologies. In this paper, we investigate the impact of process variations on different types of c...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
ISVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance ...
TVLSI
2008
13 years 4 months ago
2008
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance o...