20 search results - page 3 / 4 » BIST Based Interconnect Fault Location for FPGAs |
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
— Fault diagnosis has particular importance in the context of field programmable gate arrays (FPGAs) because faults can be avoided by reconfiguration at almost no real cost. Cl...
ACST
2006
13 years 6 months ago
2006
Adaptive fault isolation methods based on discrepancyenabled pairwise comparisons are developed for reconfigurable logic devices. By observing the discrepancy characteristics of m...
FPL
2005
Springer
13 years 11 months ago
2005
Springer
This paper presents a revised model for the yield analysis of FPGA interconnect layers. Based on proven yield models, this work improves the predictions and assumptions of previous...
FPL
2006
Springer
13 years 9 months ago
2006
Springer
As manufacturing technology enters the ultra-deep submicron era, wafer yields are destined to drop due to higher occurrence of physical defects on the die. This paper proposes a y...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Modern FPGAs have been designed with advanced integrated circuit techniques that allow high speed and low power performance, joined to reconfiguration capabilities. This makes new...