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» Block-level 3D IC design with through-silicon-via planning
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DATE
2009
IEEE
154views Hardware» more  DATE 2009»
14 years 4 days ago
Reliability aware through silicon via planning for 3D stacked ICs
Abstract—This work proposes reliability aware through silicon via (TSV) planning for the 3D stacked silicon integrated circuits (ICs). The 3D power distribution network is modele...
Amirali Shayan Arani, Xiang Hu, He Peng, Chung-Kua...
3DIC
2009
IEEE
279views Hardware» more  3DIC 2009»
14 years 6 days ago
Compact modelling of Through-Silicon Vias (TSVs) in three-dimensional (3-D) integrated circuits
Abstract—Modeling parasitic parameters of Through-SiliconVia (TSV) structures is essential in exploring electrical characteristics such as delay and signal integrity (SI) of circ...
Roshan Weerasekera, Matt Grange, Dinesh Pamunuwa, ...
VLSI
2010
Springer
13 years 3 months ago
Design and feasibility of multi-Gb/s quasi-serial vertical interconnects based on TSVs for 3D ICs
—This paper proposes a novel technique to exploit the high bandwidth offered by through silicon vias (TSVs). In the proposed approach, synchronous parallel 3D links are replaced ...
Fengda Sun, Alessandro Cevrero, Panagiotis Athanas...
GLVLSI
2009
IEEE
262views VLSI» more  GLVLSI 2009»
13 years 3 months ago
Power distribution paths in 3-D ICS
Distributing power and ground to a vertically integrated system is a complex and difficult task. Interplane communication and power delivery are achieved by through silicon vias (...
Vasilis F. Pavlidis, Giovanni De Micheli
ASPDAC
2012
ACM
279views Hardware» more  ASPDAC 2012»
12 years 1 months ago
Block-level 3D IC design with through-silicon-via planning
— Since re-designing and re-optimizing existing logic, memory, and IP blocks in a 3D fashion significantly increases design cost, nearterm three-dimensional integrated circuit (...
Dae Hyun Kim, Rasit Onur Topaloglu, Sung Kyu Lim