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ITC
1999
IEEE
103views Hardware» more  ITC 1999»
13 years 9 months ago
Resistive bridge fault modeling, simulation and test generation
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
Vijay R. Sar-Dessai, D. M. H. Walker
ITC
1996
IEEE
78views Hardware» more  ITC 1996»
13 years 9 months ago
Realistic-Faults Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits
common use is the distinction into two (abstract) fault models: A new fault modelling scheme for integrated analogue general the "Single Hard Fault Model (SHFM)" and the ...
Michael J. Ohletz
ITC
1996
IEEE
107views Hardware» more  ITC 1996»
13 years 9 months ago
Digital Integrated Circuit Testing using Transient Signal Analysis
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
VTS
1996
IEEE
112views Hardware» more  VTS 1996»
13 years 9 months ago
Optimal voltage testing for physically-based faults
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
Yuyun Liao, D. M. H. Walker