27 search results - page 5 / 6 » Cost-free scan: a low-overhead scan path design |
ITC
1989
IEEE
13 years 9 months ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
Power consumption of digital systems may increase significantly during testing. In this paper, systems equipped with a scan-based built-in self-test like the STUMPS architecture a...
IWMM
2007
Springer
13 years 11 months ago
2007
Springer
Traditionally, operating systems use a coarse approximation of memory accesses to implement memory management algorithms by monitoring page faults or scanning page table entries. ...
JCB
2008
13 years 5 months ago
2008
A novel approach to the detection of genomic repeats is presented in this paper. The technique, dubbed SAGRI (Spectrum Assisted Genomic Repeat Identifier), is based on the spectru...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...