48 search results - page 1 / 10 » Customized Algorithms for High Performance Memory Test in Ad... |
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Today’s ASIC designs consist of more memory in terms of both area and number of instances. The shrinking of geometries has an even greater effect upon memories due to their tigh...
PVLDB
2010
13 years 3 months ago
2010
Large-scale data analysis has become increasingly important for many enterprises. Recently, a new distributed computing paradigm, called MapReduce, and its open source implementat...
HPCA
2009
IEEE
14 years 5 months ago
2009
IEEE
The number of functional errors escaping design verification and being released into final silicon is growing, due to the increasing complexity and shrinking production schedules ...
MICRO
2009
IEEE
13 years 11 months ago
2009
IEEE
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...