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ISQED
2008
IEEE
101views Hardware» more  ISQED 2008»
13 years 11 months ago
Projection-Based Piecewise-Linear Response Surface Modeling for Strongly Nonlinear VLSI Performance Variations
Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about highdimensional strongly nonlinear performance variations that canno...
Xin Li, Yu Cao
TCAD
2008
118views more  TCAD 2008»
13 years 5 months ago
Variability-Aware Bulk-MOS Device Design
As CMOS technology is scaled down toward the nanoscale regime, drastically growing leakage currents and variations in device characteristics are becoming two important design chall...
Javid Jaffari, Mohab Anis
DAC
2011
ACM
12 years 5 months ago
Rethinking memory redundancy: optimal bit cell repair for maximum-information storage
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...
Xin Li
VLSID
2005
IEEE
170views VLSI» more  VLSID 2005»
13 years 11 months ago
A High-Efficiency, Dual-Mode, Dynamic, Buck-Boost Power Supply IC for Portable Applications
Abstract—Integrated power supplies are critical building blocks in stateof-the-art portable applications, where they efficiently and accurately transform a battery supply into va...
Biranchinath Sahu, Gabriel A. Rincón-Mora
CACM
2000
158views more  CACM 2000»
13 years 5 months ago
Wireless Integrated Network Sensors
Wireless Integrated Network Sensors (WINS) now provide a new monitoring and control capability for transportation, manufacturing, health care, environmental monitoring, and safety...
Gregory J. Pottie, William J. Kaiser