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» Design verification via simulation and automatic test patter...
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DAC
2005
ACM
14 years 5 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
CODES
2000
IEEE
13 years 9 months ago
Automatic test bench generation for simulation-based validation
In current design practice synthesis tools play a key role, letting designers to concentrate on the specificationof the system being designed by carrying out repetitive tasks such...
Marcello Lajolo, Luciano Lavagno, Maurizio Rebaude...
DATE
2000
IEEE
132views Hardware» more  DATE 2000»
13 years 9 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
ATS
2003
IEEE
98views Hardware» more  ATS 2003»
13 years 10 months ago
Automatic Design Validation Framework for HDL Descriptions via RTL ATPG
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
Liang Zhang, Michael S. Hsiao, Indradeep Ghosh