19 search results - page 1 / 4 » Dynamic power estimation for deep submicron circuits with pr... |
ASPDAC
2010
ACM
13 years 2 months ago
2010
ACM
- Dynamic power consumption in CMOS circuits is usually estimated based on the number of signal transitions. However, when considering glitches, this is not accurate because narrow...
ISCAS
1995
IEEE
13 years 8 months ago
1995
IEEE
— This paper introduces a simple analytical model for estimating standby and switching power dissipation in deep submicron CMOS digital circuits. The model is based on Berkeley S...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
DATE
2004
IEEE
13 years 8 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...