45 search results - page 1 / 9 » Efficient Embedding of Deterministic Test Data |
ATS
2010
IEEE
13 years 1 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
ICCD
1999
IEEE
13 years 8 months ago
1999
IEEE
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
ITC
1996
IEEE
13 years 8 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
ET
2002
13 years 4 months ago
2002
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...