215 search results - page 1 / 43 » Evaluation of the statistical delay quality model |
ASPDAC
2005
ACM
13 years 6 months ago
2005
ACM
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper proposes a model for calculating statistical gate-delay variation caused by intra-chip and inter-chip variability. As the variation of individual gate delays directly i...