11 search results - page 1 / 3 » Exploiting Programmable BIST For The Diagnosis of Embedded M... |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
1 This paper addresses the issue of testing and diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper that follows a progr...
DFT
2009
IEEE
13 years 11 months ago
2009
IEEE
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the...
ASPDAC
2000
ACM
13 years 8 months ago
2000
ACM
Testing embedded memories is becoming an industry-wide concern with the advent of deep-submicron technology and system-on-chip applications. We present a prototype chip for a progr...
CSREAESA
2009
13 years 5 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...